MACCOR - Product Options

MACCOR - Battery and Cell Test Equipment Worldwide
 
  • Maccor Series 4000
  • Maccor Model 4200
  • Maccor Model 4300
  • Maccor Model 4304
  • Maccor Model 4400
  • Maccor Series 4600
  • Maccor Series 3600
  • Maccor Series 3650
  • Maccor HEV, PHEV, EV Tester
  • Maccor Formation
  • Maccor Electrochemical
  • Maccor Temperature Chamber
Previous Next

+ Options

Reference (Auxiliary) Voltage Inputs

Voltage Inputs, available in blocks of sixteen (16), are easily assigned to test channels. These voltage inputs are high impedance, fully isolated, and are offered in various ranges such as: ± 5 volts, ± 10 volts, ± 20 volts, etc. Any combination of voltage inputs can be assigned to a test channel. Data measured by these inputs becomes part of the data record for the test channel assigned and voltages measured can control flow of the test procedure (schedule).

Reference voltage inputs may be used for: 3 or 4 reference electrode experiments; differential capacity experiments, measuring individual cells within a pack, monitoring external voltages, etc. Readings may be viewed or plotted in real time, or plotted either as a single input or overlay all the inputs associated with the experiment.

Thermocouple Inputs

Thermocouple inputs, available in blocks of sixteen (16), are easily assignable to test channels. Thermocouple inputs are available for type “K”, “T”, and “J” thermocouples. Any combination of thermocouple inputs can be assigned to a test channel.

Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the test schedule. Temperature functions can be used to control flow of the test schedule on channels with thermocouple inputs on the basis of absolute temperature, ΔT/δt, ΔT, and several others.

RTD Inputs

RTD inputs, available in blocks of sixteen (16), are easily assignable to test channels. RTD inputs are isolated. Any combination of RTD inputs can be assigned to a test channel.

Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the test schedule. Temperature functions can be used to control flow of the test schedule on channels with RTD inputs on the basis of absolute temperature, ΔT/δt, ΔT, and several others.

Thermistor Inputs

Thermistor Inputs, available in blocks of sixteen (16), are easily assignable to test channels. Any combination of thermistor inputs can be assigned to a test channel.

Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the test schedule. Temperature functions can be used to control flow of the test schedule on channels with thermistor inputs on the basis of absolute temperature, ΔT/δt, ΔT, and several others.

Pressure (Strain Gauge) Inputs

Pressure Inputs, available in blocks of sixteen (16), are easily assignable to test channels. Pressure inputs are designed to be used with 100mV transducers as standard. Any combination of RTD inputs can be assigned to a test channel.

Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of pressure for the test schedule. Pressure functions can be used to control flow of the test schedule on channels with pressure inputs on the basis of absolute pressure, ΔP/δt, ΔP, and several others.

External Charge Controller

External Charge Controllers can be added to any or all of the test channels. These devices work as follows: The test channel retains all of the capabilities it normally has. In addition, tests run on the channel can connect to an external charger during a charge controller step. During such connection, all the data gathering capabilities and all the step end conditions of the test channel can still be used.

External Load Controller

External Load Controllers can be added to any or all of the test channels. These devices work as follows: The test channel retains all of the capabilities it normally has. In addition, tests run on the channel can connect to an external load during a load controller step. During such connection, all the data gathering capabilities and all the step end conditions of the test channel can still be used.

Frequency Response Analyzer (FRA 0355)

Maccor’s Frequency Response Analyzer (FRA 0355) may be added to new and existing test systems running Maccor’s Windows based software. The FRA with the built-in eight (8) position Multiplexer add full AC impedance analysis to a test system allowing frequency scans without disturbing the device under test or its connections at any time during the test. The positions on the multiplexer are assignable to any test channel in the system.

Data from the FRA include: frequency, magnitude, phase angle, real and imaginary impedances, and capacitance or inductance. Standard plots available in the MIMS Client include: Nyquist, Bode, magnitude, real, imaginary impedances, and phase angle versus frequency, real or imaginary impedances, cycle, voltage, capacity, energy, or power.

LED Status Indicators

Test channel interface can be fitted with a green LED status indicator. The LED provides a visual indicator on the test system when the channel is active.

8-Bit Digital Inputs

This hardware option provides seven TTL optically isolated input bits for a tester channel. The flow of the test procedure may be controlled based on the bit values (high or low).

8-Bit Digital Outputs

With this hardware option, a tester channel may set individual lines of TTL outputs high or low during the test. These lines may be used to trigger an event or simply display status lights.

Telecom Pulsing

This option allows test channels to perform popular Telecom and similar pulse profiles. The period for the tester channel is adjustable from 4.6 to 10 mS, with pulses available from 100 µS on up. All channels on a single controller board are set to the desired period. In the test procedure, the magnitude and pulse duration are set.

Multi-Level Pulsing

For demanding tests, this option provides the flexibility to create a train of up to sixteen pulses (slots). Individual pulses may from 100 µS on up provided one of the pulses is greater than 1 mS. Once the train has been created, it is looped until the programmed end criteria is reached.

 
sales@maccor.com    +1 918 446 1874
 
© 2012 Maccor, Inc. All Rights Reserved