Reference (Auxiliary) Voltage Inputs
Voltage Inputs, available in blocks of sixteen (16), are easily assigned to test channels. These voltage inputs are high impedance, fully isolated,
and are offered in various ranges such as: ± 5 volts, ± 10 volts, ± 20 volts, etc. Any combination of voltage inputs can be
assigned to a test channel. Data measured by these inputs becomes part of the data record for the test channel assigned and voltages measured can
control flow of the test procedure (schedule).
Reference voltage inputs may be used for: 3 or 4 reference electrode experiments; differential capacity experiments, measuring individual
cells within a pack, monitoring external voltages, etc. Readings may be viewed or plotted in real time, or plotted either as a single input
or overlay all the inputs associated with the experiment.
Thermocouple Inputs
Thermocouple inputs, available in blocks of sixteen (16), are easily assignable to test channels. Thermocouple inputs are available for type
“K”, “T”, and “J” thermocouples. Any combination of thermocouple inputs can be assigned to a test channel.
Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the
test schedule. Temperature functions can be used to control flow of the test schedule on channels with thermocouple inputs on the basis of absolute
temperature, ΔT/δt, ΔT, and several others.
RTD Inputs
RTD inputs, available in blocks of sixteen (16), are easily assignable to test channels. RTD inputs are isolated. Any combination of
RTD inputs can be assigned to a test channel.
Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the test schedule.
Temperature functions can be used to control flow of the test schedule on channels with RTD inputs on the basis of absolute temperature,
ΔT/δt, ΔT, and several others.
Thermistor Inputs
Thermistor Inputs, available in blocks of sixteen (16), are easily assignable to test channels. Any combination of thermistor inputs can be
assigned to a test channel.
Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of temperature for the
test schedule. Temperature functions can be used to control flow of the test schedule on channels with thermistor inputs on the basis of absolute
temperature, ΔT/δt, ΔT, and several others.
Pressure (Strain Gauge) Inputs
Pressure Inputs, available in blocks of sixteen (16), are easily assignable to test channels. Pressure inputs are designed to be used with 100mV
transducers as standard. Any combination of RTD inputs can be assigned to a test channel.
Data measured by these inputs becomes part of the data record for the test channel assigned creating a historical record of pressure for the test schedule.
Pressure functions can be used to control flow of the test schedule on channels with pressure inputs on the basis of absolute pressure,
ΔP/δt, ΔP, and several others.
External Charge Controller
External Charge Controllers can be added to any or all of the test channels. These devices work as follows: The test channel retains all of the
capabilities it normally has. In addition, tests run on the channel can connect to an external charger during a charge controller step. During
such connection, all the data gathering capabilities and all the step end conditions of the test channel can still be used.
External Load Controller
External Load Controllers can be added to any or all of the test channels. These devices work as follows: The test channel retains all of the
capabilities it normally has. In addition, tests run on the channel can connect to an external load during a load controller step. During such
connection, all the data gathering capabilities and all the step end conditions of the test channel can still be used.
Frequency Response Analyzer (FRA 0355)
Maccor’s Frequency Response Analyzer (FRA 0355) may be added to new and existing test systems running Maccor’s Windows based software.
The FRA with the built-in eight (8) position Multiplexer add full AC impedance analysis to a test system allowing frequency scans without disturbing
the device under test or its connections at any time during the test. The positions on the multiplexer are assignable to any test channel in the system.
Data from the FRA include: frequency, magnitude, phase angle, real and imaginary impedances, and capacitance or inductance. Standard plots available
in the MIMS Client include: Nyquist, Bode, magnitude, real, imaginary impedances, and phase angle versus frequency, real or imaginary impedances,
cycle, voltage, capacity, energy, or power.
LED Status Indicators
Test channel interface can be fitted with a green LED status indicator. The LED provides a visual indicator on the test system when the channel is active.
8-Bit Digital Inputs
This hardware option provides seven TTL optically isolated input bits for a tester channel. The flow of the test procedure may be
controlled based on the bit values (high or low).
8-Bit Digital Outputs
With this hardware option, a tester channel may set individual lines of TTL outputs high or low during the test. These lines may be used to
trigger an event or simply display status lights.
Telecom Pulsing
This option allows test channels to perform popular Telecom and similar pulse profiles. The period for the tester channel is adjustable from 4.6 to 10 mS,
with pulses available from 100 µS on up. All channels on a single controller board are set to the desired period. In the test procedure, the magnitude
and pulse duration are set.
Multi-Level Pulsing
For demanding tests, this option provides the flexibility to create a train of up to sixteen pulses (slots). Individual pulses may from 100 µS on
up provided one of the pulses is greater than 1 mS. Once the train has been created, it is looped until the programmed end criteria is reached.